Semiconductor

Confocal microscopy is a metrology method deployed widely in the manufacturing of semiconductor, electronics, and displays.   In combination with MicroPoint Laser Illumination and Ablation Systems, it is possible to precisely micromachine, mark, and index semiconductors including ICs, disk media, displays and microfluidic channels, during the inspection process.

Technical Notes

The Technical Notes below, downloadable in Adobe pdf format, describe how MicroPoint Laser Illumination and Ablation Systems can be used in semiconductor processing.

Navigation on Hard Disk, Unpatterned Wafers and IC's
Hard Disk Marking
Height Selective Circuit Isolation on Multilayer Integrated Circuits
Integrated Circuits - Imaging of Laser Navigation Marks in E-Beam Devices
Removal of Passivation from Integrated Circuits
Probe Station Systems
Probe Station Systems - Circuit Isolation